Bayesian Neural Networks and Applications to Speckle Data and Soft-X-Ray 
Diagnostics

von Toussaint, U.

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Bayesian Neural Networks and Applications to Speckle Data and Soft-X-Ray Diagnostics

von Toussaint, U. (2005). Bayesian Neural Networks and Applications to Speckle Data and Soft-X-Ray Diagnostics. Talk presented at Bereichsseminar. Garching. 2005-11-24.

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Datensatz-Permalink: https://hdl.handle.net/21.11116/0000-0000-10D6-C Versions-Permalink: https://hdl.handle.net/21.11116/0000-0000-10D7-B

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Urheber:
von Toussaint, U.^{1, 2}, Autor

Affiliations:
1Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856328
2Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856288