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  Deuterium depth profiling in JT-60U tiles using the D3(He,p)4He resonant nuclear reaction

Hayashi, T., Sugiyama, K., Krieger, K., Mayer, M., Alimov, V., Tanabe, T., et al. (2006). Deuterium depth profiling in JT-60U tiles using the D3(He,p)4He resonant nuclear reaction. Poster presented at 17th International Conference of Plasma Surface Interactions in Controlled Fusion Devices (PSI 17), Hefei Anhui.

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 Creators:
Hayashi, T.1, Author
Sugiyama, K.2, Author              
Krieger, K.2, Author              
Mayer, M.2, Author              
Alimov, V.2, Author              
Tanabe, T.1, Author
Masaki, K.1, Author
Miya, N.1, Author
Affiliations:
1Japan Atomic Energy Agency, Mukouyama 801-1, Naka, Ibaraki 311-0193, Japan Interdisciplinary Graduate School of Engineering Sciences, Kyushu University, Hakozaki 6-10-1, Higashi-ku, Fukuoka 812-8581, Japan Institute of Physical Chemistry of the Russian Academy of Sciences, Leninskii prospekt 31, 117915 Moscow, Russia, ou_persistent22              
2Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856328              

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Language(s): eng - English
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 Publication Status: Not specified
 Pages: -
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 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 287253
 Degree: -

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Title: 17th International Conference of Plasma Surface Interactions in Controlled Fusion Devices (PSI 17)
Place of Event: Hefei Anhui
Start-/End Date: 2006-05-22 - 2006-05-26

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