Deuterium depth profiling in JT-60U tiles using the D3(He,p)4He resonant 
nuclear reaction

Hayashi, T.; Sugiyama, K.; Krieger, K.; Mayer, M.; Alimov, V.; Tanabe, T.; Masaki, K.; Miya, N.

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Deuterium depth profiling in JT-60U tiles using the D3(He,p)4He resonant nuclear reaction

Hayashi, T., Sugiyama, K., Krieger, K., Mayer, M., Alimov, V., Tanabe, T., et al. (2006). Deuterium depth profiling in JT-60U tiles using the D3(He,p)4He resonant nuclear reaction. Poster presented at 17th International Conference of Plasma Surface Interactions in Controlled Fusion Devices (PSI 17), Hefei Anhui.

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Datensatz-Permalink: https://hdl.handle.net/21.11116/0000-0000-14EE-E Versions-Permalink: https://hdl.handle.net/21.11116/0000-0000-14EF-D

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Urheber:
Hayashi, T.¹, Autor
Sugiyama, K.², Autor
Krieger, K.², Autor
Mayer, M.², Autor
Alimov, V.², Autor
Tanabe, T.¹, Autor
Masaki, K.¹, Autor
Miya, N.¹, Autor

Affiliations:
1Japan Atomic Energy Agency, Mukouyama 801-1, Naka, Ibaraki 311-0193, Japan Interdisciplinary Graduate School of Engineering Sciences, Kyushu University, Hakozaki 6-10-1, Higashi-ku, Fukuoka 812-8581, Japan Institute of Physical Chemistry of the Russian Academy of Sciences, Leninskii prospekt 31, 117915 Moscow, Russia, ou_persistent22
2Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856328