Ion Beam analysis of H/D retention in the near surface layers of JT-60U plasma 
facing wall tiles

Sugiyama, K.; Hayashi, T.; Krieger, K.; Mayer, M.; Masaki, K.; Miya, N.; Tanabe, T.

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Ion Beam analysis of H/D retention in the near surface layers of JT-60U plasma facing wall tiles

Sugiyama, K., Hayashi, T., Krieger, K., Mayer, M., Masaki, K., Miya, N., et al. (2006). Ion Beam analysis of H/D retention in the near surface layers of JT-60U plasma facing wall tiles. Poster presented at 17th International Conference of Plasma Surface Interactions in Controlled Fusion Devices, Hefei Anhui.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0000-14F0-A Version Permalink: http://hdl.handle.net/21.11116/0000-0000-14F1-9

Genre: Poster

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Creators:
Sugiyama, K.¹, Author
Hayashi, T.², Author
Krieger, K.¹, Author
Mayer, M.¹, Author
Masaki, K.², Author
Miya, N.², Author
Tanabe, T.², Author

Affiliations:
1Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856328
2Japan Atomic Energy Agency, Mukouyama 801-1, Naka, Ibaraki 311-0193, Japan Interdisciplinary Graduate School of Engineering Sciences, Kyushu University, Hakozaki 6-10-1, Higashi-ku, Fukuoka 812-8581, Japan Institute of Physical Chemistry of the Russian Academy of Sciences, Leninskii prospekt 31, 117915 Moscow, Russia, ou_persistent22

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Language(s): eng - English

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Publication Status: Not specified

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Identifiers: eDoc: 287254

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Title: 17th International Conference of Plasma Surface Interactions in Controlled Fusion Devices

Place of Event: Hefei Anhui

Start-/End Date: 2006-05-22 - 2006-05-26

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