Experimental and Theoretical Wavelength of EUV Emission Lines from Highly 
Charged Xenon Ions

Biedermann, C.; Radtke, R.; Schwob, J. L.; Mandelbaum, P.

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Experimental and Theoretical Wavelength of EUV Emission Lines from Highly Charged Xenon Ions

Biedermann, C., Radtke, R., Schwob, J. L., & Mandelbaum, P. (2006). Experimental and Theoretical Wavelength of EUV Emission Lines from Highly Charged Xenon Ions. Poster presented at DPG - Frühjahrstagung des Arbeitskreises Atome, Moleküle, Quantenoptik und Plasmen (AMOP), Frankfurt /Main.

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Datensatz-Permalink: https://hdl.handle.net/21.11116/0000-0000-180B-A Versions-Permalink: https://hdl.handle.net/21.11116/0000-0000-180C-9

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Urheber:
Biedermann, C.¹, Autor
Radtke, R.¹, Autor
Schwob, J. L.², Autor
Mandelbaum, P.², Autor

Affiliations:
1Plasma Diagnostics Group (HUB), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856324
2Racah Institute of Physics, The Hebrew University, Jerusalem/Israel, ou_persistent22