Nanocrystallization in vanadium doped carbon films studied by means of X-Ray 
emission spectroscopy

Sikora, M.; Adelhelm, C.; Balden, M.; Schneider, K.; Kapusta, C.; Glatzel, P.

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Nanocrystallization in vanadium doped carbon films studied by means of X-Ray emission spectroscopy

Sikora, M., Adelhelm, C., Balden, M., Schneider, K., Kapusta, C., & Glatzel, P. (2008). Nanocrystallization in vanadium doped carbon films studied by means of X-Ray emission spectroscopy. Talk presented at 9th International School and Symposium on Synchrotron Radiation in Natural Science (ISSRNS 2008). Ameliowka. 2008-06-15 - 2008-06-20.

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Datensatz-Permalink: https://hdl.handle.net/21.11116/0000-0000-1E2E-D Versions-Permalink: https://hdl.handle.net/21.11116/0000-0000-1E31-8

Genre: Vortrag

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Urheber:
Sikora, M.¹, Autor
Adelhelm, C.², Autor
Balden, M.², Autor
Schneider, K.¹, Autor
Kapusta, C.¹, Autor
Glatzel, P.¹, Autor

Affiliations:
1European Synchrotron Radiation Facility, 6 rue Jules Horowitz, 38043 Grenoble, France; AGH University of Science and Technology, Al. Mickiewicza 30, 30-059 Cracow, Poland, ou_persistent22
2Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856328