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  Nanoscale Conductivity and Strain Field Mapping by IR and THz Near-Field Nanoscopy

Huber, A. J., Keilmann, F., Wittborn, J., Aizpurua, J., Ziegler, A., Köck, T., et al. (2009). Nanoscale Conductivity and Strain Field Mapping by IR and THz Near-Field Nanoscopy. Talk presented at International Conference on Frontiers of Characterization and Metrology for Nanoelectronics. Albany, NY. 2009-05-11 - 2009-05-14.

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 Creators:
Huber, A. J.1, Author
Keilmann, F.2, Author           
Wittborn, J.1, Author
Aizpurua, J.1, Author
Ziegler, A.1, Author
Köck, T.3, Author           
Hillenbrand, R.1, Author
Affiliations:
1Nanotopics Laboratory, CIC nanoGUNE, 20009 Donostia - San Sebastian, Spain; Infineon Technologies AG, 18739 München, Germany; Donostia International Physics Center (DIPC), 20018 Donostia - San Sebastian, Spain, ou_persistent22              
2External Organizations, ou_persistent22              
3Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856328              

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Language(s): eng - English
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 Publication Status: Not specified
 Pages: -
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 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 395980
 Degree: -

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Title: International Conference on Frontiers of Characterization and Metrology for Nanoelectronics
Place of Event: Albany, NY
Start-/End Date: 2009-05-11 - 2009-05-14

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