Nanoscale Conductivity and Strain Field Mapping by IR and THz Near-Field 
Nanoscopy

Huber, A. J.; Keilmann, F.; Wittborn, J.; Aizpurua, J.; Ziegler, A.; Köck, T.; Hillenbrand, R.

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Nanoscale Conductivity and Strain Field Mapping by IR and THz Near-Field Nanoscopy

Huber, A. J., Keilmann, F., Wittborn, J., Aizpurua, J., Ziegler, A., Köck, T., et al. (2009). Nanoscale Conductivity and Strain Field Mapping by IR and THz Near-Field Nanoscopy. Talk presented at International Conference on Frontiers of Characterization and Metrology for Nanoelectronics. Albany, NY. 2009-05-11 - 2009-05-14.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0000-228E-A Version Permalink: https://hdl.handle.net/21.11116/0000-0000-228F-9

Genre: Talk

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Creators:
Huber, A. J.¹, Author
Keilmann, F.², Author
Wittborn, J.¹, Author
Aizpurua, J.¹, Author
Ziegler, A.¹, Author
Köck, T.³, Author
Hillenbrand, R.¹, Author

Affiliations:
1Nanotopics Laboratory, CIC nanoGUNE, 20009 Donostia - San Sebastian, Spain; Infineon Technologies AG, 18739 München, Germany; Donostia International Physics Center (DIPC), 20018 Donostia - San Sebastian, Spain, ou_persistent22
2External Organizations, ou_persistent22
3Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856328

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Language(s): eng - English

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Identifiers: eDoc: 395980

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Title: International Conference on Frontiers of Characterization and Metrology for Nanoelectronics

Place of Event: Albany, NY

Start-/End Date: 2009-05-11 - 2009-05-14

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