A structural characterization of a Cu/MgO (001) interface using Cs corrected TEM

Cazottes, Sophie; Zhang, Zaoli; Dehm, Gerhard

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A structural characterization of a Cu/MgO (001) interface using Cs corrected TEM

Cazottes, S., Zhang, Z., & Dehm, G. (2009). A structural characterization of a Cu/MgO (001) interface using Cs corrected TEM. In G. Kothleitner, & M. Leisch (Eds.), 9th Multinational Microscopy Conference 2009, Materials Science (pp. 69-70). Graz, Austria: Verlag der Technischen Universität Graz.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0000-05D1-E Version Permalink: http://hdl.handle.net/21.11116/0000-0000-05D2-D

Genre: Conference Paper

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Creators:
Cazottes, Sophie¹, Author
Zhang, Zaoli¹, Author
Dehm, Gerhard², Author

Affiliations:
1Erich Schmid Institute of Material Science, Austrian Academy of Sciences, Leoben, Austria, ou_persistent22
2Department of Materials Physics, Montanuniversität Leoben, Austria, ou_persistent22

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Language(s): eng - English

Dates: Published in Print: 2009

Publication Status: Published in print

Pages: -

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Rev. Method: -

Identifiers: URI: www.univie.ac.at/asem

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Title: 9th Multinational Microscopy Conference 2009

Place of Event: Graz, Austria

Start-/End Date: 2009-08-30 - 2009-09-04

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Title: 9th Multinational Microscopy Conference 2009, Materials Science

Source Genre: Proceedings

Creator(s):
Kothleitner, Gerald, Editor
Leisch, Manfred, Editor

Affiliations:
-

Publ. Info: Graz, Austria : Verlag der Technischen Universität Graz

Pages: - Volume / Issue: 3 Sequence Number: - Start / End Page: 69 - 70 Identifier: -