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  A structural characterization of a Cu/MgO (001) interface using Cs corrected TEM

Cazottes, S., Zhang, Z., & Dehm, G. (2009). A structural characterization of a Cu/MgO (001) interface using Cs corrected TEM. In G. Kothleitner, & M. Leisch (Eds.), 9th Multinational Microscopy Conference 2009, Materials Science (pp. 69-70). Graz, Austria: Verlag der Technischen Universität Graz.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0000-05D1-E Version Permalink: http://hdl.handle.net/21.11116/0000-0000-05D2-D
Genre: Conference Paper

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 Creators:
Cazottes, Sophie1, Author              
Zhang, Zaoli1, Author              
Dehm, Gerhard2, Author              
Affiliations:
1Erich Schmid Institute of Material Science, Austrian Academy of Sciences, Leoben, Austria, ou_persistent22              
2Department of Materials Physics, Montanuniversität Leoben, Austria, ou_persistent22              

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Language(s): eng - English
 Dates: 2009
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: URI: www.univie.ac.at/asem
 Degree: -

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Title: 9th Multinational Microscopy Conference 2009
Place of Event: Graz, Austria
Start-/End Date: 2009-08-30 - 2009-09-04

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Title: 9th Multinational Microscopy Conference 2009, Materials Science
Source Genre: Proceedings
 Creator(s):
Kothleitner, Gerald, Editor
Leisch, Manfred, Editor
Affiliations:
-
Publ. Info: Graz, Austria : Verlag der Technischen Universität Graz
Pages: - Volume / Issue: 3 Sequence Number: - Start / End Page: 69 - 70 Identifier: -