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  Conventional TEM Investigation of the FIB Damage in Copper

Kiener, D., Jörg, T., Rester, M., Motz, C., & Dehm, G. (2007). Conventional TEM Investigation of the FIB Damage in Copper. In Proceeding 33rd Microscopy Conference, Deutsche Gesellschaft für Elektronenmikroskopie (pp. 100-101).

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-002E-A5C5-B Version Permalink: http://hdl.handle.net/11858/00-001M-0000-002E-A5CD-C
Genre: Conference Paper

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 Creators:
Kiener, Daniel1, Author              
Jörg, T.2, Author              
Rester, Martin3, Author              
Motz, Christian3, Author              
Dehm, Gerhard1, Author              
Affiliations:
1Department of Materials Physics, Montanuniversität Leoben, Austria, ou_persistent22              
2Erich Schmid Institute of Materials Science, Austrian Academy of Sciences, A-8700 Leoben, Austria, persistent22              
3Department of Materials Physics, Montanuniversität Leoben, Leoben, Austria, ou_persistent22              

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Language(s): eng - English
 Dates: 2007
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: -
 Degree: -

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Title: 33rd Microscopy Conference, Deutsche Gesellschaft für Elektronenmikroskopie
Place of Event: Saarbrücken, Germany
Start-/End Date: 2007-09-02 - 2007-09-07

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Title: Proceeding 33rd Microscopy Conference, Deutsche Gesellschaft für Elektronenmikroskopie
Source Genre: Proceedings
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 100 - 101 Identifier: -