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  Towards precision measurements on highly charged ions using a high harmonic generation frequency comb

Nauta, J., Borodin, A., Ledwa, H. B., Stark, J., Schwarz, M., Schmöger, L., Micke, P., Crespo López-Urrutia, J. R., & Pfeifer, T. (2017). Towards precision measurements on highly charged ions using a high harmonic generation frequency comb. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 408, 285-288.

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資料種別: 会議論文

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 作成者:
Nauta, Janko1, 著者           
Borodin, Andrii1, 著者           
Ledwa, Hans B.2, 著者
Stark, Julian1, 著者           
Schwarz, Maria1, 2, 著者           
Schmöger, Lisa1, 2, 著者           
Micke, Peter1, 2, 著者           
Crespo López-Urrutia, José R.1, 著者           
Pfeifer, Thomas1, 著者           
所属:
1Division Prof. Dr. Thomas Pfeifer, MPI for Nuclear Physics, Max Planck Society, ou_2025284              
2Physikalisch-Technische Bundesanstalt, Bundesallee 100, 38116 Braunschweig, Germany Technische Universität Berlin, Straße des 17 Juni 135, 10623 Berlin, Germany, ou_persistent22              

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 要旨: Highly charged ions (HCI) offer many advantages over neutral and singly charged ions for probing fundamental physics. Recently they have been proposed as candidates for novel frequency standards. The project presented here aims at studying HCI with high precision in the extreme ultraviolet (XUV) region, where many of their transitions are located. To this end, an XUV light source is being developed, using a stabilized frequency comb to generate high-order harmonics inside the focus of an enhancement cavity. This optical resonator resides in an ultra-high vacuum (UHV) chamber and is designed to have a very tight focus. The generated XUV light will be guided to a cryogenic linear Paul trap, where trapped HCI are sympathetically cooled by Be+ ions. Individual comb lines can then be used to drive narrow transitions in HCI, enabling XUV spectroscopy with unprecedented accuracy.

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言語: eng - English
 日付: 2017-10-01
 出版の状態: 出版
 ページ: -
 出版情報: -
 目次: -
 査読: -
 識別子(DOI, ISBNなど): DOI: 10.1016/j.nimb.2017.04.077
 学位: -

関連イベント

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イベント名: 18th International Conference on the Physics of Highly Charged Ions (HCI)
開催地: Kielce, Poland
開始日・終了日: 2016-09-11 - 2016-09-16

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出版物 1

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出版物名: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
  省略形 : NIM B
種別: 学術雑誌
 著者・編者:
Banaś, Dariusz1, 編集者
Pajek, Marek, 著者
所属:
1 Jan Kochanowski University, ou_persistent22            
出版社, 出版地: Amsterdam : Elsevier B.V.
ページ: - 巻号: 408 通巻号: - 開始・終了ページ: 285 - 288 識別子(ISBN, ISSN, DOIなど): ISSN: 0168-583X
CoNE: https://pure.mpg.de/cone/journals/resource/954925484704