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  Reduction of phase singularities in a speckle Michelson setup

Mantel, K., & Nercissian, V. (2017). Reduction of phase singularities in a speckle Michelson setup. In OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION X. 1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA: SPIE-INT SOC OPTICAL ENGINEERING. doi:10.1117/12.2269429.

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 Urheber:
Mantel, K.1, Autor           
Nercissian, V.1, Autor           
Affiliations:
1Optical Design and Microoptics, Leuchs Division, Max Planck Institute for the Science of Light, Max Planck Society, ou_2364704              

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Schlagwörter: Instruments & Instrumentation; Optics; Speckle interferometry; phase singularities;
 Zusammenfassung: Speckle interferometry is an optical metrology technique for characterizing rough surfaces. In one application, the deformation of a specimen under a load may be determined by comparing measurements before and after the load is applied. Owing to the surface roughness, however, the results are impaired by phase singularities, leading to a strong noise in the measurement results. Usually, filtering and smoothing operations are performed to reduce the noise. However, these procedures also affect the underlying systematic phase and are therefore disadvantageous. Instead, we examine incoherent averaging, a physical procedure, to reduce the number of phase singularities in the first place. We tailor the spatial coherence of the light using extended light sources of continuous or multipoint shape, achieving smoother phase distributions. The mechanism behind the reduction process involves subtle effects like enhancing phase singularity correlations in the fields before and after the deformation takes place.

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Sprache(n): eng - English
 Datum: 2017
 Publikationsstatus: Online veröffentlicht
 Seiten: 6
 Ort, Verlag, Ausgabe: -
 Inhaltsverzeichnis: -
 Art der Begutachtung: -
 Identifikatoren: ISI: 000407289600048
DOI: 10.1117/12.2269429
 Art des Abschluß: -

Veranstaltung

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Titel: Conference on Optical Measurement Systems for Industrial Inspection X part of the SPIE Optical Metrology Symposium
Veranstaltungsort: Munich, GERMANY
Start-/Enddatum: 2017-06-26 - 2017-06-29

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Titel: OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION X
Genre der Quelle: Konferenzband
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Affiliations:
Ort, Verlag, Ausgabe: 1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA : SPIE-INT SOC OPTICAL ENGINEERING
Seiten: - Band / Heft: - Artikelnummer: UNSP 103291N Start- / Endseite: - Identifikator: ISSN: 0277-786X
ISBN: 978-1-5106-1104-7; 978-1-5106-1103-0

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Titel: Proceedings of SPIE
Genre der Quelle: Reihe
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Affiliations:
Ort, Verlag, Ausgabe: -
Seiten: - Band / Heft: 10329 Artikelnummer: - Start- / Endseite: - Identifikator: ISSN: 0277-786X