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  Reduction of phase singularities in a speckle Michelson setup

Mantel, K., & Nercissian, V. (2017). Reduction of phase singularities in a speckle Michelson setup. In OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION X. 1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA: SPIE-INT SOC OPTICAL ENGINEERING. doi:10.1117/12.2269429.

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 Creators:
Mantel, K.1, Author           
Nercissian, V.1, Author           
Affiliations:
1Optical Design and Microoptics, Leuchs Division, Max Planck Institute for the Science of Light, Max Planck Society, ou_2364704              

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Free keywords: Instruments & Instrumentation; Optics; Speckle interferometry; phase singularities;
 Abstract: Speckle interferometry is an optical metrology technique for characterizing rough surfaces. In one application, the deformation of a specimen under a load may be determined by comparing measurements before and after the load is applied. Owing to the surface roughness, however, the results are impaired by phase singularities, leading to a strong noise in the measurement results. Usually, filtering and smoothing operations are performed to reduce the noise. However, these procedures also affect the underlying systematic phase and are therefore disadvantageous. Instead, we examine incoherent averaging, a physical procedure, to reduce the number of phase singularities in the first place. We tailor the spatial coherence of the light using extended light sources of continuous or multipoint shape, achieving smoother phase distributions. The mechanism behind the reduction process involves subtle effects like enhancing phase singularity correlations in the fields before and after the deformation takes place.

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Language(s): eng - English
 Dates: 2017
 Publication Status: Published online
 Pages: 6
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: ISI: 000407289600048
DOI: 10.1117/12.2269429
 Degree: -

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Title: Conference on Optical Measurement Systems for Industrial Inspection X part of the SPIE Optical Metrology Symposium
Place of Event: Munich, GERMANY
Start-/End Date: 2017-06-26 - 2017-06-29

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Title: OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION X
Source Genre: Proceedings
 Creator(s):
Affiliations:
Publ. Info: 1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA : SPIE-INT SOC OPTICAL ENGINEERING
Pages: - Volume / Issue: - Sequence Number: UNSP 103291N Start / End Page: - Identifier: ISSN: 0277-786X
ISBN: 978-1-5106-1104-7; 978-1-5106-1103-0

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Title: Proceedings of SPIE
Source Genre: Series
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Publ. Info: -
Pages: - Volume / Issue: 10329 Sequence Number: - Start / End Page: - Identifier: ISSN: 0277-786X