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  Study of the morphology of organic ferroelectric diodes with combined scanning force and scanning transmission X-ray microscopy

Bernard, L., Khikhlovskyi, V., van Breemen, A., Michels, J. J., Janssen, R., Kemerink, M., et al. (2018). Study of the morphology of organic ferroelectric diodes with combined scanning force and scanning transmission X-ray microscopy. Organic Electronics, 53, 242-248. doi:10.1016/j.orgel.2017.11.012.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0000-2B4E-A Version Permalink: http://hdl.handle.net/21.11116/0000-0000-2B4F-9
Genre: Journal Article

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 Creators:
Bernard, L., Author
Khikhlovskyi, V., Author
van Breemen, A., Author
Michels, Jasper J.1, Author              
Janssen, R., Author
Kemerink, M., Author
Gelinck, G., Author
Pilet, N., Author
Affiliations:
1Dept. Blom: Molecular Electronics, MPI for Polymer Research, Max Planck Society, ou_1800284              

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Language(s): eng - English
 Dates: 2018
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: DOI: 10.1016/j.orgel.2017.11.012
 Degree: -

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Title: Organic Electronics
  Other : Org. Electron.
Source Genre: Journal
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Publ. Info: Amsterdam : North-Holland
Pages: - Volume / Issue: 53 Sequence Number: - Start / End Page: 242 - 248 Identifier: ISSN: 1566-1199
CoNE: https://pure.mpg.de/cone/journals/resource/110978984570513