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  Grain boundary segregation in multicrystalline Silicon studied by correlative microscopy

Stoffers, A. (2017). Grain boundary segregation in multicrystalline Silicon studied by correlative microscopy. PhD Thesis, RWTH Aachen, Aachen, Germany.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0000-3CFE-0 Version Permalink: http://hdl.handle.net/21.11116/0000-0000-3CFF-F
Genre: Thesis

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 Creators:
Stoffers, Andreas1, Author              
Raabe, Dierk1, Referee              
Mayer, Joachim2, Referee              
Schneider, Jochen Michael3, Referee              
Affiliations:
1Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381              
2Central Facility for Electron Microscopy, RWTH Aachen University, Aachen, Germany, ou_persistent22              
3Materials Chemistry, Lehrstuhl für Werkstoffchemie, RWTH Aachen, Germany, ou_persistent22              

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Language(s): eng - English
 Dates: 2017-05-19
 Publication Status: Accepted / In Press
 Pages: -
 Publishing info: Aachen, Germany : RWTH Aachen
 Table of Contents: -
 Rev. Method: -
 Identifiers: -
 Degree: PhD

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