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  Joint Characterization of Crystallography and Chemistry on the Nanometer Scale by Correlative Electron Microscopy and Atom Probe Tomography

Herbig, M. (2016). Joint Characterization of Crystallography and Chemistry on the Nanometer Scale by Correlative Electron Microscopy and Atom Probe Tomography. Talk presented at Interdisciplinary Symposium on 3D Microscopy, Congress Center, Les Diablerets. Les Diablerets, Switzerland. 2016-10-18 - 2016-10-21.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0000-3E1F-A Version Permalink: http://hdl.handle.net/21.11116/0000-0000-3E20-7
Genre: Talk

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 Creators:
Herbig, Michael1, Author              
Affiliations:
1Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384              

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Language(s): eng - English
 Dates: 2016-10
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: -
 Degree: -

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Title: Interdisciplinary Symposium on 3D Microscopy, Congress Center, Les Diablerets
Place of Event: Les Diablerets, Switzerland
Start-/End Date: 2016-10-18 - 2016-10-21
Invited: Yes

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