Joint Characterization of Crystallography and Chemistry on the Nanometer Scale 
by Correlative Electron Microscopy and Atom Probe Tomography

Herbig, Michael

Lokale TagsFreigabegeschichteDetailsÜbersicht

Joint Characterization of Crystallography and Chemistry on the Nanometer Scale by Correlative Electron Microscopy and Atom Probe Tomography

Herbig, M. (2016). Joint Characterization of Crystallography and Chemistry on the Nanometer Scale by Correlative Electron Microscopy and Atom Probe Tomography. Talk presented at Interdisciplinary Symposium on 3D Microscopy, Congress Center, Les Diablerets. Les Diablerets, Switzerland. 2016-10-18 - 2016-10-21.

Item is Freigegeben

einblenden: alle ausblenden: alle

Basisdaten

einblenden: ausblenden:

Datensatz-Permalink: https://hdl.handle.net/21.11116/0000-0000-3E1F-A Versions-Permalink: https://hdl.handle.net/21.11116/0000-0000-3E20-7

Genre: Vortrag

ausblenden:

Urheber:
Herbig, Michael¹, Autor

Affiliations:
1Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384