Comparison of power deposition profiles during ELMs using Langmuir probes and 
Infra-Red Camera diagnostic at JET

Jachmich, S.; Eich, T.; Fundamenski, W.

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Comparison of power deposition profiles during ELMs using Langmuir probes and Infra-Red Camera diagnostic at JET

Jachmich, S., Eich, T., & Fundamenski, W. (2009). Comparison of power deposition profiles during ELMs using Langmuir probes and Infra-Red Camera diagnostic at JET. Poster presented at 36th EPS Conference on Plasma Physics, Sofia.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0000-5008-D Version Permalink: https://hdl.handle.net/21.11116/0000-0000-5009-C

Genre: Poster

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Creators:
Jachmich, S., Author
Eich, T.¹, Author
Fundamenski, W., Author

Affiliations:
1Tokamak Edge and Divertor Physics (E2), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856308

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Language(s): eng - English

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Publication Status: Not specified

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Identifiers: eDoc: 437503

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Title: 36th EPS Conference on Plasma Physics

Place of Event: Sofia

Start-/End Date: 2009-06-29 - 2009-07-03

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