High resolution scanning transmission electron microscopy (HR STEM) analysis of 
tungsten-doped amorphous carbon films

Rasinski, M.; Plocinski, T.; Adelhelm, C.; Balden, M.; Ciupinski, L.; Kurzydlowski, K. J.

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High resolution scanning transmission electron microscopy (HR STEM) analysis of tungsten-doped amorphous carbon films

Rasinski, M., Plocinski, T., Adelhelm, C., Balden, M., Ciupinski, L., & Kurzydlowski, K. J. (2010). High resolution scanning transmission electron microscopy (HR STEM) analysis of tungsten-doped amorphous carbon films. Poster presented at European Energy Conference, Barcelona.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0000-506B-E Version Permalink: https://hdl.handle.net/21.11116/0000-0000-506C-D

Genre: Poster

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Creators:
Rasinski, M.¹, Author
Plocinski, T.², Author
Adelhelm, C.¹, Author
Balden, M.¹, Author
Ciupinski, L.², Author
Kurzydlowski, K. J.², Author

Affiliations:
1Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856328
2Warsaw University of Technology, Faculty of Material Science and Engineering, Woloska 141, 02-507, Poland, ou_persistent22

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Language(s): eng - English

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Publication Status: Not specified

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Identifiers: eDoc: 439071

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Title: European Energy Conference

Place of Event: Barcelona

Start-/End Date: 2010-04-20 - 2010-04-23

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