High resolution scanning transmission electron microscopy (HR STEM) analysis of 
redeposited layer on ASDEX Upgrade tile

Rasinski, M.; Balden, M.; Fortuna-Zalesna, E.; Neu, R.; Lewandowska, M.; Kurzydlowski, K. J.; ASDEX Upgrade Team

Lokale TagsFreigabegeschichteDetailsÜbersicht

High resolution scanning transmission electron microscopy (HR STEM) analysis of redeposited layer on ASDEX Upgrade tile

Rasinski, M., Balden, M., Fortuna-Zalesna, E., Neu, R., Lewandowska, M., Kurzydlowski, K. J., et al. (2010). High resolution scanning transmission electron microscopy (HR STEM) analysis of redeposited layer on ASDEX Upgrade tile. Poster presented at 26th Symposium on Fusion Technology (SOFT 2010), Porto.

Item is Freigegeben

einblenden: alle ausblenden: alle

Basisdaten

einblenden: ausblenden:

Datensatz-Permalink: https://hdl.handle.net/21.11116/0000-0000-53B1-A Versions-Permalink: https://hdl.handle.net/21.11116/0000-0000-53B2-9

Genre: Poster

ausblenden:

Urheber:
Rasinski, M.¹, Autor
Balden, M.¹, Autor
Fortuna-Zalesna, E.², Autor
Neu, R.³, Autor
Lewandowska, M.², Autor
Kurzydlowski, K. J.², Autor
ASDEX Upgrade Team, Autor

Affiliations:
1Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856328
2Warsaw University of Technology, Faculty of Material Science and Engineering, Woloska 141, 02-507, Poland, ou_persistent22
3Tokamak Edge and Divertor Physics (E2), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856308