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  High resolution scanning transmission electron microscopy (HR STEM) analysis of redeposited layer on ASDEX Upgrade tile

Rasinski, M., Balden, M., Fortuna-Zalesna, E., Neu, R., Lewandowska, M., Kurzydlowski, K. J., et al. (2010). High resolution scanning transmission electron microscopy (HR STEM) analysis of redeposited layer on ASDEX Upgrade tile. Poster presented at 26th Symposium on Fusion Technology (SOFT 2010), Porto.

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 Creators:
Rasinski, M.1, Author           
Balden, M.1, Author           
Fortuna-Zalesna, E.2, Author
Neu, R.3, Author           
Lewandowska, M.2, Author
Kurzydlowski, K. J.2, Author
ASDEX Upgrade Team, Author  
Affiliations:
1Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856328              
2Warsaw University of Technology, Faculty of Material Science and Engineering, Woloska 141, 02-507, Poland, ou_persistent22              
3Tokamak Edge and Divertor Physics (E2), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856308              

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Language(s): eng - English
 Dates:
 Publication Status: Not specified
 Pages: -
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 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 475203
 Degree: -

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Title: 26th Symposium on Fusion Technology (SOFT 2010)
Place of Event: Porto
Start-/End Date: 2010-09-27 - 2010-10-01

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