Development of an advanced holder system for a wide field of sample sizes in a 
dualbeam FIB/SEM (Helios/FEI) with EBSD/EDX

Lindig, S.; Balden, M.; Weizmann, G.

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Development of an advanced holder system for a wide field of sample sizes in a dualbeam FIB/SEM (Helios/FEI) with EBSD/EDX

Lindig, S., Balden, M., & Weizmann, G. (2010). Development of an advanced holder system for a wide field of sample sizes in a dualbeam FIB/SEM (Helios/FEI) with EBSD/EDX. Poster presented at 5. FIB-Workshop der D-A-CH-Länder, Technische Universität Wien.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0000-5438-3 Version Permalink: https://hdl.handle.net/21.11116/0000-0000-5439-2

Genre: Poster

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Creators:
Lindig, S.¹, Author
Balden, M.¹, Author
Weizmann, G.¹, Author

Affiliations:
1Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856328

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Language(s): eng - English

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Publication Status: Not specified

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Identifiers: eDoc: 476006

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Title: 5. FIB-Workshop der D-A-CH-Länder

Place of Event: Technische Universität Wien

Start-/End Date: 2010-06-28 - 2010-06-29

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