2D and 3D Stress Fields Analysis Based on Direct Mapping of the Dual-scale 
Porous Network of Plasma-sprayed Tungsten

Zivelonghi, A.; You, J. H.

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2D and 3D Stress Fields Analysis Based on Direct Mapping of the Dual-scale Porous Network of Plasma-sprayed Tungsten

Zivelonghi, A., & You, J. H. (2010). 2D and 3D Stress Fields Analysis Based on Direct Mapping of the Dual-scale Porous Network of Plasma-sprayed Tungsten. Poster presented at 5th International Conference on Multiscale Materials Modeling, Freiburg.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0000-56BF-9 Version Permalink: https://hdl.handle.net/21.11116/0000-0000-56C0-6

Genre: Poster

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Creators:
Zivelonghi, A.¹, Author
You, J. H.¹, Author

Affiliations:
1Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856328

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Language(s): eng - English

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Publication Status: Not specified

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Identifiers: eDoc: 498666

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Title: 5th International Conference on Multiscale Materials Modeling

Place of Event: Freiburg

Start-/End Date: 2010-10-04 - 2010-10-08

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