English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
  Characterization of temperature-induced changes in amorphous hydrogenated carbon thin films

Hopf, C., Angot, T., Areou, E., Cartry, G., Dürbeck, T., Gehrken, N., et al. (2011). Characterization of temperature-induced changes in amorphous hydrogenated carbon thin films. Poster presented at 13th International Workshop on Plasma-Facing Materials and Components for Fusion Applications / 1st International Conference on Fusion Energy Materials Science (13th PFMC Workshop / 1st FEMaS Conference), Rosenheim.

Item is

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Hopf, C.1, Author              
Angot, T.2, Author
Areou, E.2, Author
Cartry, G.2, Author
Dürbeck, T.3, 4, Author              
Gehrken, N.2, Author
Jacob, W.3, 4, Author              
Pardanaud, C.2, Author
Martin, C.2, Author
Roubin, P.2, Author
Schwarz-Selinger, T.3, 4, Author              
Affiliations:
1ITER Technology & Diagnostics (ITED), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856290              
2Laboratoire de Physique des Interactions Ioniques et Moléculaires, CNRS-Université de Provence, Centre Saint Jérôme, 13397 Marseille Cedex 20, France, ou_persistent22              
3Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856327              
4Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856328              

Content

show

Details

show
hide
Language(s): eng - English
 Dates:
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 521853
 Degree: -

Event

show
hide
Title: 13th International Workshop on Plasma-Facing Materials and Components for Fusion Applications / 1st International Conference on Fusion Energy Materials Science (13th PFMC Workshop / 1st FEMaS Conference)
Place of Event: Rosenheim
Start-/End Date: 2011-05-09 - 2011-05-13

Legal Case

show

Project information

show

Source

show