Ion beam analysis of porous thin films

Mayer, M.; von Toussaint, U.; Dewalque, J.; Dubreuil, O.; Henrist, C.; Cloots, R.; Mathis, F.

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Ion beam analysis of porous thin films

Mayer, M., von Toussaint, U., Dewalque, J., Dubreuil, O., Henrist, C., Cloots, R., et al. (2011). Ion beam analysis of porous thin films. Poster presented at 20th International Conference on Ion Beam Analysis (IBA 2011), Itapema, SC.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0000-5B2E-8 Version Permalink: https://hdl.handle.net/21.11116/0000-0000-5B2F-7

Genre: Poster

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Creators:
Mayer, M.^{1, 2}, Author
von Toussaint, U.^{1, 2}, Author
Dewalque, J.³, Author
Dubreuil, O.³, Author
Henrist, C.³, Author
Cloots, R.³, Author
Mathis, F.³, Author

Affiliations:
1Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856327
2Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856328
3University of Liege, Department of Chemistry, GreenMat-LCIS, B6a Sart Tilman, 3 Allee de la Chimie, 400 Liege, Belgium; Universite of Liege - FNRS - Centre Europeen d'Archeometrie - IPNAS, B5, Sart Tilman, 3 Alee du 6 aout, 4000 Liege, Belgium, ou_persistent22

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Language(s): eng - English

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Publication Status: Not specified

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Identifiers: eDoc: 522282

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Title: 20th International Conference on Ion Beam Analysis (IBA 2011)

Place of Event: Itapema, SC

Start-/End Date: 2011-04-10 - 2011-04-15

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