Molybdenum-based Thin Films: Depth-resolved Analysis of the Bonding States by 
Hard X-ray Photoelectron Spectroscopy

Franzke, E.; Gorgoi, M.; Adelhelm, C.; Reinfried, N.; Kösterbauer, H.; Winkler, J.; Linke, C.; Balden, M.

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Molybdenum-based Thin Films: Depth-resolved Analysis of the Bonding States by Hard X-ray Photoelectron Spectroscopy

Franzke, E., Gorgoi, M., Adelhelm, C., Reinfried, N., Kösterbauer, H., Winkler, J., et al. (2011). Molybdenum-based Thin Films: Depth-resolved Analysis of the Bonding States by Hard X-ray Photoelectron Spectroscopy. Poster presented at 3rd Joint BER II and BESSY II Users' Meeting, Berlin.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0000-85E9-3 Version Permalink: https://hdl.handle.net/21.11116/0000-0000-85EA-2

Genre: Poster

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Creators:
Franzke, E., Author
Gorgoi, M., Author
Adelhelm, C.^{1, 2}, Author
Reinfried, N., Author
Kösterbauer, H., Author
Winkler, J., Author
Linke, C., Author
Balden, M.^{1, 2}, Author

Affiliations:
1Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856328
2Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856327

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Language(s): eng - English

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Publication Status: Not specified

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Identifiers: eDoc: 573984

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Title: 3rd Joint BER II and BESSY II Users' Meeting

Place of Event: Berlin

Start-/End Date: 2011-11-30 - 2011-12-02

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