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  A New E×B Analyzer for Fast Ion Temperature Measurements in the Scrape-off Layer of ASDEX Upgrade and COMPASS

Komm, M., Kocan, M., & Stöckel, J. (2012). A New E×B Analyzer for Fast Ion Temperature Measurements in the Scrape-off Layer of ASDEX Upgrade and COMPASS. Poster presented at 20th International Conference on Plasma Surface Interactions 2012 (PSI 20), Aachen.

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 Creators:
Komm, M.1, Author
Kocan, M.2, Author              
Stöckel, J.3, Author              
Affiliations:
1Association EURATOM-IPP.CR, Za Slovankou 3, 18200 Prague 8, Czech Republic, ou_persistent22              
2Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856327              
3Tokamak Scenario Development (E1), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856321              

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Language(s): eng - English
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 Publication Status: Not specified
 Pages: -
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 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 609956
 Degree: -

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Title: 20th International Conference on Plasma Surface Interactions 2012 (PSI 20)
Place of Event: Aachen
Start-/End Date: 2012-05-21 - 2012-05-25

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