A New E×B Analyzer for Fast Ion Temperature Measurements in the Scrape-off 
Layer of ASDEX Upgrade and COMPASS

Komm, M.; Kocan, M.; Stöckel, J.

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A New E×B Analyzer for Fast Ion Temperature Measurements in the Scrape-off Layer of ASDEX Upgrade and COMPASS

Komm, M., Kocan, M., & Stöckel, J. (2012). A New E×B Analyzer for Fast Ion Temperature Measurements in the Scrape-off Layer of ASDEX Upgrade and COMPASS. Poster presented at 20th International Conference on Plasma Surface Interactions 2012 (PSI 20), Aachen.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0000-89C4-8 Version Permalink: https://hdl.handle.net/21.11116/0000-0000-89C5-7

Genre: Poster

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Creators:
Komm, M.¹, Author
Kocan, M.², Author
Stöckel, J.³, Author

Affiliations:
1Association EURATOM-IPP.CR, Za Slovankou 3, 18200 Prague 8, Czech Republic, ou_persistent22
2Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856327
3Tokamak Scenario Development (E1), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856321

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Language(s): eng - English

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Publication Status: Not specified

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Identifiers: eDoc: 609956

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Title: 20th International Conference on Plasma Surface Interactions 2012 (PSI 20)

Place of Event: Aachen

Start-/End Date: 2012-05-21 - 2012-05-25

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