Molybdenum-based Thin Films: Depth-resolved Analysis of the Bonding States by 
Hard X-ray Photoelectron Spectroscopy

Gorgoi, M.; Franzke, E.; Adelhelm, C.; Reinfried, N.; Köstenbauer, H.; Winkler, J.; Linke, C.; Balden, M.

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Molybdenum-based Thin Films: Depth-resolved Analysis of the Bonding States by Hard X-ray Photoelectron Spectroscopy

Gorgoi, M., Franzke, E., Adelhelm, C., Reinfried, N., Köstenbauer, H., Winkler, J., et al. (2012). Molybdenum-based Thin Films: Depth-resolved Analysis of the Bonding States by Hard X-ray Photoelectron Spectroscopy. Talk presented at 12th International Conference on Electron Spectroscopy and Structure (ICESS-12). Saint-Malo. 2012-09-16 - 2012-09-21.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0000-6A8B-D Version Permalink: https://hdl.handle.net/21.11116/0000-0010-215E-0

Genre: Talk

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Creators:
Gorgoi, M., Author
Franzke, E., Author
Adelhelm, C.¹, Author
Reinfried, N., Author
Köstenbauer, H., Author
Winkler, J., Author
Linke, C., Author
Balden, M.¹, Author

Affiliations:
1Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856327

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Language(s): eng - English

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Publication Status: Not specified

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Identifiers: eDoc: 667630

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Title: 12th International Conference on Electron Spectroscopy and Structure (ICESS-12)

Place of Event: Saint-Malo

Start-/End Date: 2012-09-16 - 2012-09-21

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