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  Microstructure and Mechanical Properties of Si and Y Doped Tantalum

Bischof, M., Mayer, S., Leitner, H., Clemens, H., Pranzas, K., Staron, P., et al. (2005). Microstructure and Mechanical Properties of Si and Y Doped Tantalum. In Proceedings of the 16th International Plansee Seminar 2005 (pp. 489-503).

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Item Permalink: http://hdl.handle.net/21.11116/0000-0000-72CF-7 Version Permalink: http://hdl.handle.net/21.11116/0000-0000-72D0-4
Genre: Conference Paper

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 Creators:
Bischof , M., Author
Mayer, Svea1, Author              
Leitner, Harald2, Author              
Clemens , H., Author
Pranzas, K., Author
Staron, Peter3, Author              
Dehm, Gerhard4, 5, Author              
Knabl , W., Author
Voiticek, A., Author
Geiger, E., Author
Affiliations:
1Department of Physical Metallurgy and Materials Testing, Montanuniversität Leoben, Franz-Josef Strasse 18, 8700 Leoben, Austria, ou_persistent22              
2Department of Physical Metallurgy and Materials Testing, Montanuniversität, A-8700 Leoben, Austria, ou_persistent22              
3Department of Physical Metallurgy and Materials Testing, Montanuniversität Leoben, Roseggerstraße 12, A-8700 Leoben, Austria, ou_persistent22              
4Department of Materials Physics, Montanuniversität Leoben, Austria, ou_persistent22              
5Erich Schmid Institute of Material Science, Austrian Academy of Sciences, Leoben, Austria, ou_persistent22              

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Language(s): eng - English
 Dates: 2005
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: -
 Degree: -

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Title: 16th International Plansee Seminar 2005
Place of Event: Reutte, Austria
Start-/End Date: 2005-05-30 - 2005-06-03

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Title: Proceedings of the 16th International Plansee Seminar 2005
Source Genre: Proceedings
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Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 1 Sequence Number: - Start / End Page: 489 - 503 Identifier: -