Voltage induced near interface changes of the magnetocrystalline anisotropy 
energy: A study by X-ray resonant techniques in combination with conventional 
magnetometry

Boltje, D.

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Voltage induced near interface changes of the magnetocrystalline anisotropy energy: A study by X-ray resonant techniques in combination with conventional magnetometry

Boltje, D. (2017). Voltage induced near interface changes of the magnetocrystalline anisotropy energy: A study by X-ray resonant techniques in combination with conventional magnetometry. Master Thesis, Universität Stuttgart, Stuttgart.

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Datensatz-Permalink: https://hdl.handle.net/21.11116/0000-0000-7238-1 Versions-Permalink: https://hdl.handle.net/21.11116/0000-0009-D607-E

Genre: Hochschulschrift

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Urheber:
Boltje, D.^{1, 2}, Autor

Affiliations:
1Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497648
2Institut für Halbleiteroptik und Funktionelle Grenzflächen, Universität Stuttgart, Allmandring 3, 70569 Stuttgart, Germany, ou_persistent22