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  Accurate terahertz spectroscopy of supported thin films by precise substrate thickness correction

Krewer, K. L., Mics, Z., Arabski, J., Schmerber, G., Beaurepaire, E., Bonn, M., et al. (2018). Accurate terahertz spectroscopy of supported thin films by precise substrate thickness correction. Optics Letters, 43(3), 447-450. doi:10.1364/OL.43.000447.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0000-76F1-B Version Permalink: http://hdl.handle.net/21.11116/0000-0000-76F3-9
Genre: Journal Article

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 Creators:
Krewer, Keno L.1, Author              
Mics, Zoltan1, Author              
Arabski, J., Author
Schmerber, G., Author
Beaurepaire, E., Author
Bonn, Mischa1, Author              
Turchinovich, Dmitry1, Author              
Affiliations:
1Dept. Bonn: Molecular Spectroscopy, MPI for Polymer Research, Max Planck Society, ou_1800285              

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Language(s): eng - English
 Dates: 2018
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: DOI: 10.1364/OL.43.000447
 Degree: -

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Title: Optics Letters
Source Genre: Journal
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Publ. Info: Washington : Optical Society of America
Pages: - Volume / Issue: 43 (3) Sequence Number: - Start / End Page: 447 - 450 Identifier: ISSN: 0146-9592
CoNE: /journals/resource/954925474435