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  Chemically resolved depth profiles from synchrotron XPS of oxygen ion-driven reactions with Be2W

Köppen, M., Schmid, K., Löchel, H., Phan, T.-V., Riesch, J., Vollmer, A., et al. (2012). Chemically resolved depth profiles from synchrotron XPS of oxygen ion-driven reactions with Be2W. Poster presented at 25th Symposium on Surface Science 2012 (3S'12), St. Christoph/Arlberg.

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 Creators:
Köppen, M.1, Author              
Schmid, K.2, Author              
Löchel, H., Author
Phan, T.-V.3, Author              
Riesch, J.2, Author              
Vollmer, A., Author
Linsmeier, Ch.2, Author              
Affiliations:
1W7-X: Engineering (EN), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856300              
2Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856327              
3Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856328              

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Language(s): eng - English
 Dates:
 Publication Status: Not specified
 Pages: -
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 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 576188
 Degree: -

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Title: 25th Symposium on Surface Science 2012 (3S'12)
Place of Event: St. Christoph/Arlberg
Start-/End Date: 2012-03-11 - 2012-03-17

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