Chemically resolved depth profiles from synchrotron XPS of oxygen ion-driven 
reactions with Be2W

Köppen, M.; Schmid, K.; Löchel, H.; Phan, T.-V.; Riesch, J.; Vollmer, A.; Linsmeier, Ch.

Local TagsRelease HistoryDetailsSummary

Chemically resolved depth profiles from synchrotron XPS of oxygen ion-driven reactions with Be2W

Köppen, M., Schmid, K., Löchel, H., Phan, T.-V., Riesch, J., Vollmer, A., et al. (2012). Chemically resolved depth profiles from synchrotron XPS of oxygen ion-driven reactions with Be2W. Poster presented at 25th Symposium on Surface Science 2012 (3S'12), St. Christoph/Arlberg.

Item is Released

show all hide all

Basic

show hide

Item Permalink: https://hdl.handle.net/21.11116/0000-0000-C0B0-F Version Permalink: https://hdl.handle.net/21.11116/0000-0000-C0B1-E

Genre: Poster

Files

show Files

Locators

show

Creators

show

hide

Creators:
Köppen, M.¹, Author
Schmid, K.², Author
Löchel, H., Author
Phan, T.-V.³, Author
Riesch, J.², Author
Vollmer, A., Author
Linsmeier, Ch.², Author

Affiliations:
1W7-X: Engineering (EN), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856300
2Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856327
3Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856328

Content

show

Details

show

hide

Language(s): eng - English

Dates:

Publication Status: Not specified

Pages: -

Publishing info: -

Table of Contents: -

Rev. Type: -

Identifiers: eDoc: 576188

Degree: -

Event

show

hide

Title: 25th Symposium on Surface Science 2012 (3S'12)

Place of Event: St. Christoph/Arlberg

Start-/End Date: 2012-03-11 - 2012-03-17

Legal Case

show

Project information

show

Source

show