Chemically resolved depth profiles from synchrotron XPS of oxygen ion-driven 
reactions with Be2W

Köppen, M.; Schmid, K.; Löchel, H.; Phan, T.-V.; Riesch, J.; Vollmer, A.; Linsmeier, Ch.

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Chemically resolved depth profiles from synchrotron XPS of oxygen ion-driven reactions with Be2W

Köppen, M., Schmid, K., Löchel, H., Phan, T.-V., Riesch, J., Vollmer, A., et al. (2012). Chemically resolved depth profiles from synchrotron XPS of oxygen ion-driven reactions with Be2W. Poster presented at 25th Symposium on Surface Science 2012 (3S'12), St. Christoph/Arlberg.

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Datensatz-Permalink: https://hdl.handle.net/21.11116/0000-0000-C0B0-F Versions-Permalink: https://hdl.handle.net/21.11116/0000-0000-C0B1-E

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Urheber:
Köppen, M.¹, Autor
Schmid, K.², Autor
Löchel, H., Autor
Phan, T.-V.³, Autor
Riesch, J.², Autor
Vollmer, A., Autor
Linsmeier, Ch.², Autor

Affiliations:
1W7-X: Engineering (EN), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856300
2Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856327
3Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856328