Ultrathin Silica Films Studied by LEEM and XPEEM

Schmidt, Thomas

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Ultrathin Silica Films Studied by LEEM and XPEEM

Schmidt, T. (2017). Ultrathin Silica Films Studied by LEEM and XPEEM. Talk presented at SpectroNanoscopy 2017 workshop. Seoul, South Korea. 2017-09.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0000-BFE8-4 Version Permalink: https://hdl.handle.net/21.11116/0000-0000-BFE9-3

Genre: Talk

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Creators:
Schmidt, Thomas¹, Author

Affiliations:
1Chemical Physics, Fritz Haber Institute, Max Planck Society, ou_24022

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Title: SpectroNanoscopy 2017 workshop

Place of Event: Seoul, South Korea

Start-/End Date: 2017-09

Invited: Yes

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