Growth, Morphology and Structure of Ultra-Thin Silica Films Studied by 
Spectro-Microscopy

Schmidt, Thomas

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Growth, Morphology and Structure of Ultra-Thin Silica Films Studied by Spectro-Microscopy

Schmidt, T. (2017). Growth, Morphology and Structure of Ultra-Thin Silica Films Studied by Spectro-Microscopy. Talk presented at FHI/CP-USTC/CP Workshop on Surface Chemistry of Oxides. Hefei, China. 2017-06.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0000-CEBC-5 Version Permalink: https://hdl.handle.net/21.11116/0000-0000-CEBD-4

Genre: Talk

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Creators:
Schmidt, Thomas¹, Author

Affiliations:
1Chemical Physics, Fritz Haber Institute, Max Planck Society, ou_24022

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Language(s): eng - English

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Publication Status: Not specified

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Title: FHI/CP-USTC/CP Workshop on Surface Chemistry of Oxides

Place of Event: Hefei, China

Start-/End Date: 2017-06

Invited: Yes

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