English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
Add to Basket
 Local TagsRelease HistoryDetailsSummary
  Toroidal Constraints for Two Point Localization Under High Outlier Ratios

Camposeco, F., Sattler, T., Cohen, A., Geiger, A., & Pollefeys, M. (2017). Toroidal Constraints for Two Point Localization Under High Outlier Ratios. In 2017 IEEE Conference on Computer Vision and Pattern Recognition (CVPR 2017) (pp. 6700-6708). Piscataway, NJ: IEEE. doi:10.1109/CVPR.2017.709.

Item is

 

show all hide all

Basic

show hide
Item Permalink: https://hdl.handle.net/21.11116/0000-0000-FE10-0 Version Permalink: https://hdl.handle.net/21.11116/0000-000A-ABE3-5
Genre: Conference Paper

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Camposeco, Federico1, Author
Sattler, Torsten1, Author
Cohen, Andrea1, Author
Geiger, Andreas2, Author           
Pollefeys, Marc1, Author
Affiliations:
1External Organizations, ou_persistent22              
2Max Planck Research Group Autonomous Vision, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_2344692              

Content

show
hide
Free keywords: Forschungsgruppe Geiger
 Abstract: -

Details

show
hide
Language(s): eng - English
 Dates: 2017-11-092017
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: BibTex Citekey: Camposeco2017CVPR
DOI: 10.1109/CVPR.2017.709
 Degree: -

Event

show
hide
Title: IEEE Conference on Computer Vision and Pattern Recognition (CVPR 2017)
Place of Event: Honolulu, HI
Start-/End Date: 2017-07-21 - 2017-07-26

Legal Case

show

Project information

show

Source 1

show
hide
Title: 2017 IEEE Conference on Computer Vision and Pattern Recognition (CVPR 2017)
Source Genre: Proceedings
 Creator(s):
Affiliations:
Publ. Info: Piscataway, NJ : IEEE
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 6700 - 6708 Identifier: ISBN: 978-1-5386-0457-1
ISBN: 978-1-5386-0458-8
ISSN: 1063-6919
DOI: 10.1109/CVPR35066.2017