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  Toroidal Constraints for Two Point Localization Under High Outlier Ratios

Camposeco, F., Sattler, T., Cohen, A., Geiger, A., & Pollefeys, M. (2017). Toroidal Constraints for Two Point Localization Under High Outlier Ratios. In 2017 IEEE Conference on Computer Vision and Pattern Recognition (CVPR 2017) (pp. 6700-6708). Piscataway, NJ: IEEE. doi:10.1109/CVPR.2017.709.

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Genre: Conference Paper

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 Creators:
Camposeco, Federico1, Author
Sattler, Torsten1, Author
Cohen, Andrea1, Author
Geiger, Andreas2, Author           
Pollefeys, Marc1, Author
Affiliations:
1External Organizations, ou_persistent22              
2Max Planck Research Group Autonomous Vision, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_2344692              

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Free keywords: Forschungsgruppe Geiger
 Abstract: -

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Language(s): eng - English
 Dates: 2017-11-092017
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: BibTex Citekey: Camposeco2017CVPR
DOI: 10.1109/CVPR.2017.709
 Degree: -

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Title: IEEE Conference on Computer Vision and Pattern Recognition (CVPR 2017)
Place of Event: Honolulu, HI
Start-/End Date: 2017-07-21 - 2017-07-26

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Title: 2017 IEEE Conference on Computer Vision and Pattern Recognition (CVPR 2017)
Source Genre: Proceedings
 Creator(s):
Affiliations:
Publ. Info: Piscataway, NJ : IEEE
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 6700 - 6708 Identifier: ISBN: 978-1-5386-0457-1
ISBN: 978-1-5386-0458-8
ISSN: 1063-6919
DOI: 10.1109/CVPR35066.2017