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  Testing Cyber-Physical Systems through Bayesian Optimization

Deshmukh, J., Horvat, M., Jin, X., Majumdar, R., & Prabhu, V. (2017). Testing Cyber-Physical Systems through Bayesian Optimization. ACM Transactions on Embedded Computing Systems, 16(5s): 170, pp. 1-18. doi:10.1145/3126521.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0000-E7CD-5 Version Permalink: http://hdl.handle.net/21.11116/0000-0000-E7E5-9
Genre: Journal Article
Latex : Testing Cyber-Physical Systems through {B}ayesian Optimization

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 Creators:
Deshmukh, Jyotirmoy1, Author
Horvat, Marko2, Author              
Jin, Xiaoqing1, Author
Majumdar, Rupak2, Author              
Prabhu, Vinayak2, Author              
Affiliations:
1External Organizations, ou_persistent22              
2Group R. Majumdar, Max Planck Institute for Software Systems, Max Planck Society, ou_2105292              

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Language(s): eng - English
 Dates: 20172017
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: BibTex Citekey: Deshmukh:2017:TCS:3145508.3126521
DOI: 10.1145/3126521
 Degree: -

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Title: ACM Transactions on Embedded Computing Systems
Source Genre: Journal
 Creator(s):
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Publ. Info: New York, NY : ACM
Pages: - Volume / Issue: 16 (5s) Sequence Number: 170 Start / End Page: 1 - 18 Identifier: -