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  Microstructural characterisation of Bi2Se3thin films

Tarakina, N. V., Schreyeck, S., Borzenko, T., Grauer, S., Schumacher, C., Karczewski, G., et al. (2013). Microstructural characterisation of Bi2Se3thin films. Journal of Physics: Conference Series, 471(1): 012043.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0000-F4A0-7 Version Permalink: http://hdl.handle.net/21.11116/0000-0000-F4A1-6
Genre: Conference Paper

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 Creators:
Tarakina, Nadezda V.1, Author              
Schreyeck, S., Author
Borzenko, T., Author
Grauer, S., Author
Schumacher, C., Author
Karczewski, G., Author
Gould, C., Author
Brunner, K., Author
Buhmann, H., Author
Molenkamp, L.W., Author
Affiliations:
1Nadezda V. Tarakina, Kolloidchemie, Max Planck Institute of Colloids and Interfaces, Max Planck Society, ou_2522693              

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 Dates: 2013
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Degree: -

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Title: 18th Microscopy of Semiconducting Materials Conference (MSM XVIII)
Place of Event: Oxford
Start-/End Date: 2013-04-07 - 2013-04-11

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Title: Journal of Physics: Conference Series
Source Genre: Journal
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Publ. Info: Bristol : IOP Publishing
Pages: - Volume / Issue: 471 (1) Sequence Number: 012043 Start / End Page: - Identifier: ISSN: 1742-6588