Comparative study of the microstructure of Bi 2Se 3 thin films grown on Si(111) 
and InP(111) substrates

Tarakina, Nadezda V.; Schreyeck, S.; Borzenko, T.; Schumacher, C.; Karczewski, G.; Brunner, K.; Gould, C.; Buhmann, H.; Molenkamp, L.W.

doi:10.1021/cg201636g

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Comparative study of the microstructure of Bi ₂Se ₃ thin films grown on Si(111) and InP(111) substrates

Tarakina, N. V., Schreyeck, S., Borzenko, T., Schumacher, C., Karczewski, G., Brunner, K., et al. (2012). Comparative study of the microstructure of Bi ₂Se ₃ thin films grown on Si(111) and InP(111) substrates. Crystal Growth & Design, 12(4), 1913-1918. doi:10.1021/cg201636g.

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Datensatz-Permalink: https://hdl.handle.net/21.11116/0000-0000-F48B-0 Versions-Permalink: https://hdl.handle.net/21.11116/0000-0010-4521-B

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Urheber:
Tarakina, Nadezda V.¹, Autor
Schreyeck, S., Autor
Borzenko, T., Autor
Schumacher, C., Autor
Karczewski, G., Autor
Brunner, K., Autor
Gould, C., Autor
Buhmann, H., Autor
Molenkamp, L.W., Autor

Affiliations:
1External Organizations, ou_persistent22