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  Mediating exchange bias by Verwey transition in CoO/Fe3O4 thin film

Liu, X. H., Liu, W., Zhang, Z. D., & Chang, C. F. (2018). Mediating exchange bias by Verwey transition in CoO/Fe3O4 thin film. Journal of Applied Physics, 123(8): 083903, pp. 1-5. doi:10.1063/1.5023725.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0001-2254-A Version Permalink: http://hdl.handle.net/21.11116/0000-0001-2257-7
Genre: Journal Article

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 Creators:
Liu, X. H.1, Author              
Liu, W.2, Author
Zhang, Z. D.2, Author
Chang, C. F.3, Author              
Affiliations:
1Physics of Correlated Matter, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863445              
2external, ou_persistent22              
3Chun-Fu Chang, Physics of Correlated Matter, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863447              

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 Abstract: We report the tunability of the exchange bias effect by the first-order metal-insulator transition (known as the Verwey transition) of Fe3O4 in CoO (5 nm)/Fe3O4 (40 nm)/MgO (001) thin film. In the vicinity of the Verwey transition, the exchange bias field is substantially enhanced because of a sharp increase in magnetocrystalline anisotropy constant from high-temperature cubic to low-temperature monoclinic structure. Moreover, with respect to the Fe3O4 (40 nm)/MgO (001) thin film, the coercivity field of the CoO (5 nm)/Fe3O4 (40 nm)/MgO (001) bilayer is greatly increased for all the temperature range, which would be due to the coupling between Co spins and Fe spins across the interface. Published by AIP Publishing.

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Language(s): eng - English
 Dates: 2018-02-282018-02-28
 Publication Status: Published in print
 Pages: -
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 Table of Contents: -
 Rev. Method: -
 Identifiers: ISI: 000427003300013
DOI: 10.1063/1.5023725
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Title: Journal of Applied Physics
  Abbreviation : J. Appl. Phys.
Source Genre: Journal
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Publ. Info: New York, NY : AIP Publishing
Pages: - Volume / Issue: 123 (8) Sequence Number: 083903 Start / End Page: 1 - 5 Identifier: ISSN: 0021-8979
CoNE: /journals/resource/991042723401880