Validation of electron temperature profiles on W7-X as measured using a x-ray 
imaging crystal spectrometer

Pablant, N. A.; Langenberg, A.; Alonso, A.; Bitter, M.; Bozhenkov, S.; Burhenn, R.; Delgado-Aparicio, L.; Fuchert, G.; Gates, D.; Hill, K. W.; Höfel, U.; Hirsch, M.; Kring, J.; Marchuk, O.; Mardenfeld, M.; Pasch, E.; Pavone, A.; Reinke, M.; Scott, E.; Svensson, J.; Traverso, P.; Weir, G.; Wegner, T.; W7-X Team, Max Planck Institute for Plasma Physics, Max Planck Society

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Validation of electron temperature profiles on W7-X as measured using a x-ray imaging crystal spectrometer

Pablant, N. A., Langenberg, A., Alonso, A., Bitter, M., Bozhenkov, S., Burhenn, R., et al. (2018). Validation of electron temperature profiles on W7-X as measured using a x-ray imaging crystal spectrometer. Poster presented at 22nd Topical Conference on High Temperature Plasma Diagnostics (HTPD 2018), San Diego, CA.

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Datensatz-Permalink: https://hdl.handle.net/21.11116/0000-0001-2AF6-B Versions-Permalink: https://hdl.handle.net/21.11116/0000-0001-2AF7-A

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Urheber:
Pablant, N. A.¹, Autor
Langenberg, A.², Autor
Alonso, A.¹, Autor
Bitter, M.¹, Autor
Bozhenkov, S.², Autor
Burhenn, R.³, Autor
Delgado-Aparicio, L.¹, Autor
Fuchert, G.², Autor
Gates, D.¹, Autor
Hill, K. W.¹, Autor
Höfel, U.², Autor
Hirsch, M.², Autor
Kring, J.¹, Autor
Marchuk, O.¹, Autor
Mardenfeld, M.¹, Autor
Pasch, E.², Autor
Pavone, A.², Autor
Reinke, M.¹, Autor
Scott, E.², Autor
Svensson, J.³, Autor
Traverso, P.¹, AutorWeir, G.³, Autor         Wegner, T.³, Autor         W7-X Team, Max Planck Institute for Plasma Physics, Max Planck Society, Autor             mehr..

Affiliations:
1External Organizations, ou_persistent22
2Stellarator Heating and Optimisation (E3), Max Planck Institute for Plasma Physics, Max Planck Society, ou_2040305
3Stellarator Dynamics and Transport (E5), Max Planck Institute for Plasma Physics, Max Planck Society, ou_2040306