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  Validation of electron temperature profiles on W7-X as measured using a x-ray imaging crystal spectrometer

Pablant, N. A., Langenberg, A., Alonso, A., Bitter, M., Bozhenkov, S., Burhenn, R., et al. (2018). Validation of electron temperature profiles on W7-X as measured using a x-ray imaging crystal spectrometer. Poster presented at 22nd Topical Conference on High Temperature Plasma Diagnostics (HTPD 2018), San Diego, CA.

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 Creators:
Pablant, N. A.1, Author
Langenberg, A.2, Author           
Alonso, A.1, Author
Bitter, M.1, Author
Bozhenkov, S.2, Author           
Burhenn, R.3, Author           
Delgado-Aparicio, L.1, Author
Fuchert, G.2, Author           
Gates, D.1, Author
Hill, K. W.1, Author
Höfel, U.2, Author           
Hirsch, M.2, Author           
Kring, J.1, Author
Marchuk, O.1, Author
Mardenfeld, M.1, Author
Pasch, E.2, Author           
Pavone, A.2, Author           
Reinke, M.1, Author
Scott, E.2, Author           
Svensson, J.3, Author           
Traverso, P.1, AuthorWeir, G.3, Author           Wegner, T.3, Author           W7-X Team, Max Planck Institute for Plasma Physics, Max Planck Society, Author               more..
Affiliations:
1External Organizations, ou_persistent22              
2Stellarator Heating and Optimisation (E3), Max Planck Institute for Plasma Physics, Max Planck Society, ou_2040305              
3Stellarator Dynamics and Transport (E5), Max Planck Institute for Plasma Physics, Max Planck Society, ou_2040306              

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Language(s): eng - English
 Dates: 2018
 Publication Status: Submitted
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: -
 Degree: -

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Title: 22nd Topical Conference on High Temperature Plasma Diagnostics (HTPD 2018)
Place of Event: San Diego, CA
Start-/End Date: 2018-04-16 - 2018-04-19

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