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  Analysis of metalic impurity content by means of VUV and SXR diagnostics in the presence of ICRF induced hot-spot on the JET-ILW poloidal limiter

Czarnecka, A., Krawczyk, N., Jacquet, P., Lerche, E., Bobkov, V., Challis, C., et al. (2018). Analysis of metalic impurity content by means of VUV and SXR diagnostics in the presence of ICRF induced hot-spot on the JET-ILW poloidal limiter. Poster presented at 22nd Topical Conference on High Temperature Plasma Diagnostics (HTPD 2018), San Diego, CA.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0001-2B3B-E Version Permalink: https://hdl.handle.net/21.11116/0000-0001-2B3C-D
Genre: Poster

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 Creators:
Czarnecka, A.1, Author
Krawczyk, N.1, Author
Jacquet, P.1, Author
Lerche, E.1, Author
Bobkov, V.2, Author           
Challis, C.1, Author
Frigione, D.1, Author
Graves, J.1, Author
Lawson, K. D.1, Author
Mantsinen, M.1, Author
Meneses, L.1, Author
Pawelec, E.1, Author
Pütterich, T.3, Author           
Sertoli, M.1, Author
Valisa, M.1, Author
Van Eester, D.1, Author
Affiliations:
1External Organizations, ou_persistent22              
2Tokamak Scenario Development (E1), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856321              
3Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856327              

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Language(s): eng - English
 Dates: 2018
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: -
 Degree: -

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Title: 22nd Topical Conference on High Temperature Plasma Diagnostics (HTPD 2018)
Place of Event: San Diego, CA
Start-/End Date: 2018-04-16 - 2018-04-19

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