Wisconsin In-Situ Penning (WISP) Gauge – A new tool for partial pressure 
measurements of light impurities in strong magnetic fields

Kremeyer, T.; Flesch, K.; Paschkowski, N.; Pedersen, T. S.; Schmitz, O.; Thomas, E.; Wenzel, U.; W7-X Team, Max Planck Institute for Plasma Physics, Max Planck Society

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Wisconsin In-Situ Penning (WISP) Gauge – A new tool for partial pressure measurements of light impurities in strong magnetic fields

Kremeyer, T., Flesch, K., Paschkowski, N., Pedersen, T. S., Schmitz, O., Thomas, E., et al. (2018). Wisconsin In-Situ Penning (WISP) Gauge – A new tool for partial pressure measurements of light impurities in strong magnetic fields. Poster presented at 22nd Topical Conference on High Temperature Plasma Diagnostics (HTPD 2018), San Diego, CA.

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Datensatz-Permalink: https://hdl.handle.net/21.11116/0000-0001-2F97-1 Versions-Permalink: https://hdl.handle.net/21.11116/0000-0001-2F98-0

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Urheber:
Kremeyer, T.¹, Autor
Flesch, K.¹, Autor
Paschkowski, N.², Autor
Pedersen, T. S.², Autor
Schmitz, O.¹, Autor
Thomas, E.¹, Autor
Wenzel, U.², Autor
W7-X Team, Max Planck Institute for Plasma Physics, Max Planck Society, Autor

Affiliations:
1External Organizations, ou_persistent22
2Stellarator Edge and Divertor Physics (E4), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856286