Wisconsin In-Situ Penning (WISP) Gauge – A new tool for partial pressure 
measurements of light impurities in strong magnetic fields

Kremeyer, T.; Flesch, K.; Paschkowski, N.; Pedersen, T. S.; Schmitz, O.; Thomas, E.; Wenzel, U.; W7-X Team, Max Planck Institute for Plasma Physics, Max Planck Society

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Wisconsin In-Situ Penning (WISP) Gauge – A new tool for partial pressure measurements of light impurities in strong magnetic fields

Kremeyer, T., Flesch, K., Paschkowski, N., Pedersen, T. S., Schmitz, O., Thomas, E., et al. (2018). Wisconsin In-Situ Penning (WISP) Gauge – A new tool for partial pressure measurements of light impurities in strong magnetic fields. Poster presented at 22nd Topical Conference on High Temperature Plasma Diagnostics (HTPD 2018), San Diego, CA.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0001-2F97-1 Version Permalink: https://hdl.handle.net/21.11116/0000-0001-2F98-0

Genre: Poster

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Creators:
Kremeyer, T.¹, Author
Flesch, K.¹, Author
Paschkowski, N.², Author
Pedersen, T. S.², Author
Schmitz, O.¹, Author
Thomas, E.¹, Author
Wenzel, U.², Author
W7-X Team, Max Planck Institute for Plasma Physics, Max Planck Society, Author

Affiliations:
1External Organizations, ou_persistent22
2Stellarator Edge and Divertor Physics (E4), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856286

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Language(s): eng - English

Dates: Submitted: 2018

Publication Status: Submitted

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Title: 22nd Topical Conference on High Temperature Plasma Diagnostics (HTPD 2018)

Place of Event: San Diego, CA

Start-/End Date: 2018-04-16 - 2018-04-19

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