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  Creep Behavior and Microstructural Stability of Lamellar gamma-TiAl (Cr,Mo,Si,B) with Extremely Fine Lamellar Spacing

Schillinger, W., Zhang, D., Dehm, G., Bartels, A., & Clemens, H. (2001). Creep Behavior and Microstructural Stability of Lamellar gamma-TiAl (Cr,Mo,Si,B) with Extremely Fine Lamellar Spacing. In Materials Research Society Symposium - Proceedings (pp. N141-N146).

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Genre: Conference Paper

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 Creators:
Schillinger, Wolfram1, Author           
Zhang, Dezhi1, Author           
Dehm, Gerhard2, Author           
Bartels, Arno3, Author           
Clemens, Helmut2, Author           
Affiliations:
1Materials Science and Technology, TUHH, Hamburg, Germany, persistent22              
2Materials Science and Technology, TUHH, Hamburg, Germany, ou_persistent22              
3Materials Science and Technology, Technical University Hamburg-Harburg, D-21073 Hamburg, Germany, ou_persistent22              

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Language(s): eng - English
 Dates: 2001
 Publication Status: Published in print
 Pages: 6
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: -
 Degree: -

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Title: Materials Research Society Symposium - High Temperature Ordered Intermetallic Alloys IX, Code 59218
Place of Event: Boston, MA, USA
Start-/End Date: 2000-11-27 - 2000-11-29

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Title: Materials Research Society Symposium - Proceedings
Source Genre: Proceedings
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Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 646 Sequence Number: - Start / End Page: N141 - N146 Identifier: -