English
 
User Manual Privacy Policy Disclaimer Contact us
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
  Measurement of the Interfacial Shear Strength of Thin Copper Films on Sapphire by Microindentation Experiments

Dehm, G., Raj, R., & Rühle, M. (2011). Measurement of the Interfacial Shear Strength of Thin Copper Films on Sapphire by Microindentation Experiments. In Materials Research Symposium Proceedings 1996 (Symposium I – Polycrystalline Thin Films: Structure, Texture, Properties and Applications II) (pp. 151-156). Boston, MA, USA: Materials Research Society. doi:10.1557/PROC-403-151.

Item is

Basic

show hide
Item Permalink: http://hdl.handle.net/21.11116/0000-0001-998F-2 Version Permalink: http://hdl.handle.net/21.11116/0000-0001-9990-F
Genre: Conference Paper

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Dehm, Gerhard1, Author              
Raj, Rishi2, Author              
Rühle, Manfred3, Author              
Affiliations:
1Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655              
2Department of Materials Science and Engineering, Cornell University, Bard Hall, Ithaca, NY, 14853-1501, USA, persistent22              
3Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657              

Content

show

Details

show
hide
Language(s): eng - English
 Dates: 19962011-02-152011
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: DOI: 10.1557/PROC-403-151
 Degree: -

Event

show
hide
Title: 1996 MRS Fall Meeting & Exhibit
Place of Event: Boston, MA, USA
Start-/End Date: 1996-12-02 - 1996-12-06

Legal Case

show

Project information

show

Source 1

show
hide
Title: Materials Research Symposium Proceedings 1996 (Symposium I – Polycrystalline Thin Films: Structure, Texture, Properties and Applications II)
Source Genre: Proceedings
 Creator(s):
Affiliations:
Publ. Info: Boston, MA, USA : Materials Research Society
Pages: - Volume / Issue: 403 Sequence Number: - Start / End Page: 151 - 156 Identifier: -